Applications in Certification and Analysis

Depending on the neutron fluence rate and efficiency of the semiconductor (mostly high purity Ge-HPGe) y-ray detector available, usually the following elements can be determined by INAA in a variety of environmental and geological matrices at the mg/kg level (elements in parentheses only at somewhat elevated levels) Ag, Al, As, Au, Ba, Br, Ca, (Cd), Ce, Cl, Co, Cr, Cs, (Cu), Dy, Eu, Fe, (Ga), Hf, (Hg), (I), In, K, La, 

As an example of the capabilities of a combination of INAA and RNAA using a two group separation scheme for the simultaneous determination of As, Cd, Cu, Mo, Sb, Hg, and Se (Kucera and Soukal 1993), and a single separation procedure for vanadium determination (Byrne and Kucera 1991), Table 3.8 shows results for NIST-SRM-i573a Tomato Leaves that were obtained prior to certification of this material (Kucera 1995), and later on taken into consideration for deriving the NIST certified and information values (Becker 1995, personal communication). 

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