Analytical techniques, factors affecting success

The main factor in beam analysis that affects the reliability of the analytical information is the reproducibility of the surfaces. When using scanning electron microscopy (SEM), the apparati are connected to the computer, which makes it possible to obtain quite a bit of information about the sample, especially by X-ray and AES. However, the apparati cannot assure the same length for beam penetration on the surface, which means that the analytical information can be uncertain. Because the beam analysis is rapid, it requires very fast detectors, e.g., Ge/Li or Si/Li. The LA can be successfully used in surface analysis. An automated system has been constructed, laser-induced breakdown spectrometry (LIBS).213 This is an alternative to other surface techniques — secondary ion mas spectroscopy (SIMS), SEM, X-ray photoelectron spectroscopy (XPS) — and it increases the lateral and depth resolution. 

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