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Typical X-ray diffraction traces of the , 75 mica, 25 prophyllite composition D synthetic 1M muscovite E - natural 1M glauconite F synthetic 1M celadonite mica.

Typical X-ray diffractogram.

Typical X-ray diffractograms of 100-125 pm ground HT materials, showing purely vitreous character exhibit patches of concentrated crystalline phases visibly separated from the bulk vitreous matrix.

Typical X-ray difhaction patterns of synthesized MCM-41 sample.

Typical X-ray fiber diflOraction images of DNA

Typical x-ray mask.

Typical X-ray pattern of milled Fep3 and its decomposition into two components attributed to crystalline grains and grain boundaries

Typical X-ray pattern of nanocrystalline Pb.

Typical x-ray powder diffractometer . Key components are identified, including the trans-former power supply, x-ray source, goniometer, and detector

Typical X-ray powder pattern of the as-synthesized zeolite MCM-22 precursor

Typical X-ray powder pattern of ZSM-23 obtained with Cy-diquat as template.

Typical X-ray powder pattern of ZSM-23 obtained with Cydiquat as template.

Typical X-ray scattering pattern obtained for maize PLB after correction for background scattering and geometric factors.

Typical X-ray scattering patterns for aligned smectic samples. The director is vertical.

Typical X-ray setup with 2D detector in normal-transmission geometry. The intensity of the incident X-ray beam is measured in an ionization chamber the detector is protected by a beam stop. It is equipped with a pin-diode which records the intensity of the attenuated beam

Typical X-ray spectra

Typical x-rays of oriented samples of LC polymers in the smectic phases 5 .

Typical x3 and I3 temperature curve for PMMA showing the inflection point, which corresponds to the Tg of the polymer.

Typical xanthene and oxazine dyes.

Typical XEDS spectrum collected from a supported metal catalyst a logarithmic y-axis in order to emphasize the background signal.

Typical XP spectra measured with the AP-XPS system at the Photon Factory. The data except for the bottom spectrum were recorded for a Pd surface under 0.2 Torr of Oj at different temperatures. The bottom spectrum was taken for a clean surface under UHV at room temperature

Typical XPS Cls spectra of the surface of a 6FDA ODA film. after exposure to VUVplus atomic and molecular oxygen.

Typical XPS data tables from literature references. .

Typical XPS evolutions of Pd 3d of PdNw

Typical XPS Nls spectrum of ODPA ODA after exposure to



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