XP model

In terms of the XPS investigation, the intensity ratio Ti(2pKoxide)/Ti(2pXmetal) (a sensitive measure of oxide film thickness) and the ratio C(ls)/Ti(2p) (a sensitive function of the self-assembly coverage) depend on the distribution of local slopes of the surface relative to the mean (macroscopic) surface plane (Figure 13). The SLA surface topography profiles are too complex to be used directly within the XPS model. Therefore, the assumption was made that a mean slope may be a reasonable first approximation to be introduced as a parameter in both intensity ratios mentioned above. 

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