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X-ray spectra for

The first extensive1 study of x-ray excitation (1.17) as a method of producing x-ray spectra for analytical purposes was carried out by Glocker and Schreiber,17 who not only treated absorption effects very thoroughly and introduced the concept of critical thickness, but who... [Pg.175]

Fig. 10.8. Polarized X-ray spectra for the a a component without overcoating, b 7r component without overcoating, c a component with 0.05-p.m-thick Ch overcoating, and d -n component with 0.05-p.m-thick CH overcoating... Fig. 10.8. Polarized X-ray spectra for the a a component without overcoating, b 7r component without overcoating, c a component with 0.05-p.m-thick Ch overcoating, and d -n component with 0.05-p.m-thick CH overcoating...
An X-ray diffraction study, when possible, is the ultimate structure proof. Bond lengths are known for certainty to 0.001 A and bond angles to 0. T. Although the literature abounds with X-ray data for heterocycles there are no X-ray spectra for a 4,5-dialkyl substituted, nonionic 1,2,3-thiadiazole. However, an X-ray structure has been reported for a 1,2,3-benzothiadiazole (5), and the bond lengths and bond angles are listed in Table 1 (79AX(B)3114>. [Pg.449]

Phthalocyanines are organic semiconductors that strongly absorb visible light, and have been extensively investigated for use in photovoltaic (11), and photoelectrochemical cells (12.). The results however were somewhat inconsistent, and this was probably due to the presence of impurities which were not always clearly identified. Commercially available phthalocyanine was analyzed in order to determine the trace elements present, as well as the effect of heat treatment on the iodine contamination. The X-ray spectra, for an accumulated charge of 15 (1C, from untreated and from H2PC purified for... [Pg.118]

Analysis schemes developed for identifying clay minerals in the TEM based on EDS spectra (e.g., Murdoch et al.100) are inappropriate for colloidal samples dispersed on polycarbonate filters due to complications associated with the various sample-beam-substrate interactions that differ dramatically from that of ideal samples or standards with smooth polished surfaces.94 96 101 102 Correction procedures that account for the influence of particle size and morphology on x-ray spectra have been widely available for some time,101102 but these techniques have not been applied to the analysis of environmental particulates. To overcome the limitation of quantitative elemental analysis, some research groups have compared the x-ray spectra for sample colloids to the spectra for various minerals of similar size and composition under the same instrumental and sample preparation conditions to calibrate instrumental response.7 24 93 Noting the resolution problems associated with SEM analysis of submicron colloids, several research groups have chosen TEM as the primary discrete particle analysis technique,21 52 103 104 or have combined TEM analysis techniques, such as electron diffraction and x-ray microanalysis, to confirm conclusions drawn from SEM surveys.7,93 105... [Pg.303]

Figure 11. X-ray spectra of selected particles from Figure 10. Particles can be characterized in terms of their X-ray spectra. For example, high Si is indicative of quartz, whereas Al and Si suggest clays. In certain cases, the Si Al ratio can also distinguish between kaolinite and illite. Other components such as pyrite (Fe and S), rutile (Ti), ilmenite (Ti and Fe), and coke (C and S) can also be identified automatically by their characteristic X-rays. Figure 11. X-ray spectra of selected particles from Figure 10. Particles can be characterized in terms of their X-ray spectra. For example, high Si is indicative of quartz, whereas Al and Si suggest clays. In certain cases, the Si Al ratio can also distinguish between kaolinite and illite. Other components such as pyrite (Fe and S), rutile (Ti), ilmenite (Ti and Fe), and coke (C and S) can also be identified automatically by their characteristic X-rays.
Fig. 6. Beryllium K X-ray spectra for proton, helium, nitrogen, and argon ion bombardment... Fig. 6. Beryllium K X-ray spectra for proton, helium, nitrogen, and argon ion bombardment...
Fig. 7. K X-ray spectra for elementary boron (dashed line) and boron nitride (solid line)lx>mbarded... Fig. 7. K X-ray spectra for elementary boron (dashed line) and boron nitride (solid line)lx>mbarded...
FIGURE 5.4 Left side X-ray spectra for capture into bare and H-like uranium (forming H- and He-like uranium, respectively) as measured at ESR electron cooler. Right side Schematic presentation of the RR process of free electrons into the initially bare and H-like ions. The energy difference AE = — ha>ne gives exactly the two-electron contribution to the... [Pg.61]

Fluorescence yield is one of the major factors that determine the intensities of X-ray spectra. For each excited state of an isolated atom, the fluorescence yield is defined as tUx = Fx/Ftot in terms of the radiative and total transition probabilities F for the particular state (the transition probabilities further depend on the angular momentum quantum number, the number of electrons available for transition as well as the excitation energy). The average fluores-... [Pg.9]

Fractional integrated intensity of (111) peak with respect to total integrated intensity in X-ray spectra for unmilled and samples milled for 30, 300, and 1000min. (Reprinted with permission from Ref. 39. Copyright (2007) by Elsevier.)... [Pg.443]


See other pages where X-ray spectra for is mentioned: [Pg.209]    [Pg.176]    [Pg.43]    [Pg.38]    [Pg.215]    [Pg.325]    [Pg.330]    [Pg.11]    [Pg.482]    [Pg.215]    [Pg.497]    [Pg.61]    [Pg.1700]    [Pg.643]    [Pg.170]   
See also in sourсe #XX -- [ Pg.580 ]




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