X-ray scattering, long period

There are several methods by which the crystallite-thickness distribution can be determined. These include thin-section electron microscopy, analysis of the Raman longitudinal acoustic mode, and measurement of the small-angle X-ray-scattering long period. These methods give concordant results for narrow crystallite-thickness distributions. However, agreement is not usually observed when the thickness distribution is broad. However, when cognizance of this dispersity is taken, a rational... 

A similar analysis has also been given for poly(chlorotrifluoroethylene).(174) However, in this analysis the crystallite thickness was identified with the small-angle x-ray scattering long period. Hence there is concern over the use of the Gibbs—Thomson equation wifii fiiese data. 

---