Wide-angle scattering resolution

Consider now the wide angle scattering resolution. According to Rosenbaum and Holmes the width of a diffraction spot is determined by the demagnified source size — a —, the intrinsic width of a reflection and a dispersion term to account for the wavelength spread ... 

Details on other complementary techniques, such as small and wide angle X-ray scattering, X-ray Raman scattering, and X-ray emission, and synchrotron infrared spectromicroscopy methods are not discussed here. However, these methods can provide complementary information on the macromolecular structure and functional group chemistry of organic molecules at different resolution in different sample environments. 

Information about textural and substructural characteristics of the supports (surface area, micropore volume, crystallographic data) was derived from nitrogen and phenol adsorption data measurements, wide angle X-ray scattering (WAXS) spectra and high resolution electron microscopy (HREM). Concentrations of the surface oxides were determined using the data on the adsorption of NagCOs, NaOH, NaOEt and HCl in accordance with Boehm s method [3]. 

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