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Wavelength dispersive spectrometry

The analyst has two practical means of measuring the energy distribution of X rays emitted from the specimen energy-dispersive spectrometry and wavelength dispersive spectrometry. These two spectrometers are highly complementary the strengths of each compensate for the weaknesses of the other, and a well-equipped electron probe instrument will have both spectrometers. [Pg.179]

Potts, P.J. (1987) Principals and practices of wavelength dispersive spectrometry. In A Handbook of Silicate Rock Analysis, X-ray Fluorescence Analysis. Glasgow Blackie, pp. 226-285. [Pg.440]

Figure 7. Wavelength dispersive spectrometry (WDS) scan of the region corresponding to the two M-lines for Pb. Additional interference that are not readily visible are the two Th-M( i and Th-M 2 line around the Pb-Ma line and the Y-La line at the Pb-Ma position. The subscript 2 is for second-order lines. Figure 7. Wavelength dispersive spectrometry (WDS) scan of the region corresponding to the two M-lines for Pb. Additional interference that are not readily visible are the two Th-M( i and Th-M 2 line around the Pb-Ma line and the Y-La line at the Pb-Ma position. The subscript 2 is for second-order lines.
Wavelength dispersive spectrometry (WDS) Electron microprobe-type, generating sequential elemental acquisition. [Pg.491]

The system used in conventional wavelength dispersive spectrometry generally consists of an X-ray tube, an analyzing crystal, and detector (scintillation or gas flow proportional counter) as shown in Fig. 1.9. [Pg.20]

The wavelength dispersive spectrometry has an overall low efficiency owing to several intensity losses through the restriction on solid angles and the low reflectivity of the analyzing crystal. Furthermore, the qualitative method of... [Pg.21]

Fialin, M., Hdnoc, J., Remond, G. (1993) A survey of electron microprobe microanalysis using soft radiations difficulties and presentation of a new computer program for wavelength dispersive spectrometry. Scanning Microsc. Suppl, 7,153-166. [Pg.1044]

A study of bulk Sn/Cu and near eutectic Sn-Ag-Cu/Cu samples reflowed for approximately 60 s at 238 and 230 °C (460 and 446 °F) (Ref 41), respectively. Wavelength dispersive spectrometry (WDS) analysis showed CugSns to be growing, just as in eutectic Sn-Pb/Cu. Also, between this layer and the Cu substrate, a layer of CusSn had formed during the reflow process. [Pg.38]

It is common to use energy-dispersive spectrometry (EDS) or wavelength-dispersive spectrometry (WDS) to make chemical analyses in SEM. While WDS can have a lower detection threshold and signal-to-noise ratio (S/N) compared to EDS, it requires longer acquisition times and higher currents... [Pg.379]

See other pages where Wavelength dispersive spectrometry is mentioned: [Pg.761]    [Pg.368]    [Pg.272]    [Pg.77]    [Pg.179]    [Pg.542]    [Pg.233]    [Pg.2839]    [Pg.2866]    [Pg.463]    [Pg.1020]    [Pg.753]    [Pg.754]    [Pg.1097]    [Pg.177]    [Pg.181]    [Pg.110]    [Pg.778]    [Pg.1144]    [Pg.233]    [Pg.568]    [Pg.430]    [Pg.476]    [Pg.313]   
See also in sourсe #XX -- [ Pg.179 , Pg.340 , Pg.425 ]



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