Waller, John

Waller, John. Einstein s Luck The Truth Behind Some of the Greatest Scientific Discoveries. New York Oxford University Press, 2002. 

Martz, H. F. and R. A. Waller. Bayesian Reliability Analysis. John Wiley Sons, New York, 1982. 

William Shockley (seated), John Bardeen (standing, left), and Waller H. Braltain doing transistor research at Bell Telephone Laboratories (New York, 194S). (Corbis Corporation)... 

Sastry, S.D., Buck, K.T., Janak, J., Dressier, M. Preti, G. (1980) Volatiles emitted by humans. In G.R. Waller and O.C.Dermer (Eds.), Biochemical Applications of Mass Spectrometry, First Supplementary Volume. John Wiley, New York, pp. 1086-1129. 

Sponsoring Editor Peter Renz Project Editor Nancy Flight Manuscript Editor Larry McCombs Designer Marie Carluccio Production Coordinator William Murdock Illustration Coordinator Cheryl Nufer Artist John Waller Compositor Bi-Comp, Inc. 

Waller. H.W. Spoilage of Food by Yeasts, Food Techno ., 31. 2, 57-61 (1977) Walker. G.M. Yeast Physiology and Biotechnology , John Wiley Sons, Inc., New York, NY, 1998. 

W.H.Elliot and G.R.Weller in "Biochemical Applications of Mass Spectrometry", G.R.Waller, Ed., Wiley-Inter-science, John Wiley and Sons, Inc., New York, London (1972). 

Cheshenko N, Keller MJ, MasCasullo V, Jarvis GA, Cheng H, John M, Li J-H, Hog-arty K, Anderson RA, Waller DP, Zaneveld LJD, Profy AT, Klotman ME, Herold BC (2004) Antimicrob Agents Chemother 48 2025... 

James H. Waller, Gary W. Grimes, and John A. Matson... 

Stephens M. Introduction. In Talbot J, Waller P, eds. Stephens detection of new adverse drug reactions. West Sussex, England John Wiley Sons, Ltd 2004. 

Rutner, Stephen, Waller, Matthew A., and Mentzer, John T., A practical look at RFID, Supply Chain Management Review, January/February 2004. Schragenhiem, Eli and Dettmer, H. William, Manufacturing at Warp Speed Optimizing Supply Chain Financial Performance, Boca Raton, FL APICS/St. Lucie Press, 2001. 

Andy Waller, Rob Dryfe, Richard Webster, Nathan Lawrence, Frank Marken, and Andreas Neudeck. We thank John Freeman for the preparation of all of the figures in this manuscript. 

Contents Introduction / Robert J. Gale-X-ray techniques / James Robinson— Photoemission phenomena at metallic and semiconducting electrodes / Ricardo Bor-jas Severeyn and Robert J. Gale—UV-visible reflectance spectroscopy / Dieter M. Kolb—Infrared reflectance spectroscopy / Bernard Beden and Claude Lamy—Surface enhanced Raman scattering / Ronald L. Birke and John R. Lombardi—ESR spectroscopy of electrode processes / Richard G. Compton and Andrew M. Waller—Moss-bauer spectroscopy / Daniel A. Scherson. 

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