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Variable-Angle Spectroscopic Ellipsometry VASE

The uniformity of such an OVPD film of Alq3 is shown in Fig. 9.6. Analysis by variable angle spectroscopic ellipsometry (VASE) confirmed the surface was smooth across the entire substrate area with thickness deviation of +1.7%, a standard deviation, a, of 1.0% only. Atomic force microscopic analysis of such a typical film revealed RMS values to be 6 A, i.e. thickness differences in the range of a single monolayer only, irrespective of deposition rate [20-22]. [Pg.208]

E. Variable angle spectroscopic ellipsometry (VASE) q. Molecular assembly patterning by lift-off (MAPL)... [Pg.498]

The structural regularity of the resulting NTCDI-based ultra-thin films was tested by variable angle spectroscopic ellipsometry (VASE, Woollam Co.) at 75°. Figure 6... [Pg.408]

Other methods, such as variable-angle spectroscopic ellipsometry (VASE), can be used to obtain a depth profile of the BHJ active layers in thin-films. However, the proper modeling of the refractive indices of BHJ components and fitting is challenging, and one must contend with the fact that most polymers are highly absorbing for wavelengths in the visible spectrum." ... [Pg.293]

See other pages where Variable-Angle Spectroscopic Ellipsometry VASE is mentioned: [Pg.31]    [Pg.31]    [Pg.371]    [Pg.371]    [Pg.209]    [Pg.67]    [Pg.76]    [Pg.85]    [Pg.87]    [Pg.186]    [Pg.285]    [Pg.285]    [Pg.138]    [Pg.463]    [Pg.464]    [Pg.257]    [Pg.268]    [Pg.320]    [Pg.304]    [Pg.153]   
See also in sourсe #XX -- [ Pg.304 ]



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Ellipsometry

Spectroscopic ellipsometry

Variable-angle spectroscopic

Variable-angle spectroscopic ellipsometry

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