Transmission electron microscopy inelastic scattering

If the sample is thin enough, for example a specially prepared thin section, electrons may go straight through and be detected, as well as elastically and inelastically scattered electrons which are scattered in a forward direction. These form the basis of transmission electron microscopy (TEM). 

Unlike SEM, the inelastic scattered electrons, secondary electrons, for example, are not significant for image contrast in the TEM (if we disregard the imaging mode for STEM— scanning transmission electron microscopy ) and are excluded from analysis through the lens objective. 

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