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Transmission electron mass thickness

The transmission electron microscope (TEM) image from crazes in such films, the negative from which Fig. la was printed, can be analyzed not only to reveal dimensions of the craze but also to yield the local craze fibril volume fraction v by using a microdensitometer to measure the local density of the image, its mass thickness contrast The extension ratio of the craze fibrils, X equals i. ... [Pg.7]

Altered surfaces have been inferred from solution chemistry measurements (e.g., Chou and Wollast, 1984, 1985) and from spectroscopic measurements of altered surfaces, using such techniques as secondary ion mass spectrometry (for altered layers that are several tens of nm thick (e.g., Schweda et al, 1997), Auger electron spectroscopy (layers <10 nm thick (e.g., Hochella, 1988), XPS (layers <10 nm thick (e.g., Hochella, 1988 Muir et al, 1990), transmission electron microscopy (TEM, e.g., Casey et al, 1989b), Raman spectroscopy (e.g.. Gout et al, 1997), Fourier transform infrared spectroscopy (e.g., Hamilton et al, 2001), in situ high-resolution X-ray reflectivity (Farquhar et al, 1999b Fenter et al, 2003), nuclear magnetic resonance (Tsomaia et al, 2003), and other spectroscopies (e.g., Hellmann et al, 1997). [Pg.2337]

Sequence of electron micrographs (direct transmission and Pt/C-replicas) of ZnS films of various mass thickness A = 2nm, = lOnm, C = I5nm, D = 35nm, E = 70nm and F = 220nm [291]... [Pg.218]

The film thickness can be determined by Transmission-Electron-M icroscopy (TEM) of thin slides that had been prepared by ultramicrotomy [67]. Takahashi etal. [68] applied this technique to A1 formed gal-vanostatically at i = 1 mA cm in borate or acetate buffer. In both cases k = l,6nmV was obtained. Combining with coulometric data a density of Pox (AI2O3) = 3.5 g cm and a molar mass of M (AI2O3) = 102 g mol are determined. [Pg.243]

Scanning electron microscopy (SEM) Pig. 10, revealed an increase in the surface concentration of copper domains following additional cure. An increase in the thickness of the copper oxide layer from approximately 700 A to 1300 k was also noted by transmission electron microscopy. Post-processing was considered by the authors to be analogous to sintering wherein, small particles fuse to become a large solid mass. [Pg.124]

As in the field of condensed matter sciences, polymer research has made extensive use of conventional transmission electron microscopy (CTEM) ever since its invention. Polymer research focuses on materials that mainly consist of carbon and other light elements. These materials are relatively weak electron scatterers and therefore give low mass thickness and phase contrast. Mass thickness contrast may be enhanced using an objective aperture, staining, and/or low... [Pg.48]

Scheeren et al., 2006). Stable and catalytically active Pt(0) nanoparticles with a mean diameter of 2.3 nm (Scheeren et al., 2003) were obtained. Moreover, from transmission electron microscopy (TEM) contrast density fluctuations around the metal nanoparticles in the ionic liquid, and different thicknesses of mass density between the ionic liquid and crystalline structures were observed. [Pg.294]


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See also in sourсe #XX -- [ Pg.42 , Pg.221 ]




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Electron mass

Mass, electronic

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