Transmission acceleration voltage

Equation C tells us the radius of curvature of the path traveled by an ion with mass m and charge z. The radius of curvature is fixed by the geometry of the hardware. Ions can be selected to reach the detector by adjusting the magnetic field, B, or the accelerating voltage, V. Normally, B is varied to select ions and V is fixed near 3 000 V. Transmission of ions and detector response both decrease when V is decreased. 

The calcined samples are investigated by transmission electron microscopy (TEM) in a Philips EM 420 instrument operated at 120 kV. The specimens are deposited on a copper grid coated with a carbon film. High-resolution transmission electron microscopy (HRTEM) has been carried out at the Laboratory of Inorganic Chemistry, ETH Zurich, Switzerland, with a Philips CM20-ST microscope (accelerating voltage 300 kV). 

Electron beam exposures were performed using a modified RCA model EMV-3 transmission electron microscope. The aperture was opened to allow the beam to spread over the entire 3-inch wafer giving a uniform exposure. The accelerating voltage was 50 keV, and the dose was measured using a faraday cup (9). 

Vesicular shape and surface morphology can be assessed by transmission electron microscopy (TEM) with an accelerating voltage of 100 kV using standard techniques. 

The metal loading was measured by inductively coupled plasma-mass spectroscopy analysis. The itricrostructure and location of the metallic active phase were investigated on a Topcon EM002B transmission electron microscope working at 200 kV accelerating voltage and with a point-to-point resolution of 0.17 nm. The sample was prepared by... 

Energy dispersive X-ray microanalysis (EDX) was carried out in a transmission electron microscope JEM-2000FX fitted with a Link ANIOOOO analysis system. The phases were first identified by electron diffraction and thin edges were then andysed using a beam approximately 500 A in diameter and an acceleration voltage of 200 kV. 

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