Tip Contacts of Various Metals to Cu TCNQ

The influence of the work function of several metals as top contact to Cu(TCNQ) was investigated. Pt was the metal with the highest work fimction in this series. 

The threshold voltages for switehing between the eonducting states varied from metal to metal. A correlation between the work function and the value of the threshold voltage could not be determined because of significant fluctuations from measurement to measurement. 

Furthermore, Li- and Ca/Cu(TCNQ)Cu devices were fabricated and measured in vacuum to avoid oxidation because of their high reactivity. A Cu/Cu(TCNQ) substrate was placed into a substrate holder with two contact pins. The substrate was covered with a shadow mask that exposed only a part of the Cu stripe 

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