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Theory of Diffuse Reflectance DR Spectroscopy

The reflectance depends upon the K/S ratio and not on the absolute values of K and S. The scattering S coefficient is independent from the wavelength over wide spectral ranges and therefore the SKM function reflects the trend of the absorption K coefficient. Moreover, because SKM is a function of a(hv), a plot of (F(RJj against hv can be used to determine f g in powdered semiconductor oxides. [Pg.60]

The SKM theory has some limitations and can be applied only when the following experimental conditions are fulfilled  [Pg.60]

Moreover, diffuse reflectance depends on the particle sizes (d). When the particle size decreases, the S coefficient increases since (for d l(xm) and this [Pg.60]

Finally, it must be noted that an interesting consequence of the Kubelka-Munk (KM) equation is that DR spectroscopy has excellent properties for the analysis of trace quantities of absorbing centers dispersed in non-absorbing matrices. As shown in the following equation  [Pg.60]

UV Absorption Bands of Insulating Oxides Excitonic Sur ce States [Pg.61]


See other pages where Theory of Diffuse Reflectance DR Spectroscopy is mentioned: [Pg.59]   


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