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Surface electromagnetic wave spectroscopy SEWS

Another interesting variant of the total reflection technique is the so-called Surface Electromagnetic Wave Spectroscopy (SEWS), which consists of the generation of a surface plasmon on a substrate by frustrated total internal reflection in a prism located a few microns from the surface. This plasmon is decoupled by a second prism. Some interesting data relating to surface modes on alumina have been reported with this technique [30]. [Pg.104]

SEMPA Scanning Electron Microscopy with Polarisation Analysis, 37 SERS Surface Enhanced Raman Scattering, 32 SEW Surface Electromagnetic Waves Spectroscopy, 40 SEXAFS Surface EXAFS, 49... [Pg.596]


See other pages where Surface electromagnetic wave spectroscopy SEWS is mentioned: [Pg.514]    [Pg.627]    [Pg.514]    [Pg.627]    [Pg.574]    [Pg.602]    [Pg.171]   
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