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Spectroscopic ellipsometry solution

Recently, the adhesion of MF microparticles on a cellulose film in air as well as in liquid media was characterised using AFM. The cellulose film was made by dissolving cotton powder in N-methylmorpholine-N-oxide (NMMO) solution, followed by spinning on a silicon wafer. Spectroscopic ellipsometry was employed to measure the film thickness, and AFM was also utilised for characterising the film roughness and material distribution (Figure 20). The cotton cellulose film was also... [Pg.71]

All single proteins were adsorbed from a 0.1 mg/ml solution in HEPES 2. Gradient and reference samples were exposed to the protein solution for 15 min, then subjected to rinsing with HEPES 2 and ultrapure water, and finally dried under a stream of nitrogen. Serum and plasma were used as received without further dilution. Variable angle spectroscopic ellipsometry measurements were carried out in a dry state. [Pg.498]

Spectroscopic ellipsometry allows to detect small shifts of the phase transition temperature introduced either by a variation of the thermo-responsive polymer or the liquid environment. The latter dependency was demonstrated by Schmaljohann et al. (2003) for buffer solutions and cell culture medium and by Cordeiro et al. (2009) for artificial sea water. In both cases, the electrolyte shifts the transition temperature toward lower values. [Pg.155]

Some very important surface properties of solids can be properly characterized only by certain wet chemical techniques, some of which are currently under rapid improvement. Studies of adsorption from solution allow determination of the surface density of adsorbing sites, and the characterization of the surface forces involved (the energy of dispersion forces, the strength of acidic or basic sites and the surface density of coul-ombic charge). Adsorption studies can now be extended with some newer spectroscopic tools (Fourier-transform infra-red spectroscopy, laser Raman spectroscopy, and solid NMR spectroscopy), as well as convenient modern versions of older techniques (Doppler electrophoresis, flow microcalorimetry, and automated ellipsometry). [Pg.69]

Spectroscopic techniques give information at a more molecular level. Neutron reflections yields Information on the liquid density profile p (7) in the direction normal to the surface. This technique may lead to a non-unique solution, in that a form of P (z) is found which fits the reflection data other distributions may fit as well. With ellipsometry, introduced in sec. 1.7.10b, the... [Pg.158]

The kinetics from the solution phase have been carried out by Bain etal. using ellipsometry [47]. Later, many research groups have studied the kinetics of SAM formation (more quantitatively) using various spectroscopic techniques [48,75], such as second-harmonic generation (SHG) [76,... [Pg.6206]

Figure 24. Spectra of complex refractive index, 7 2 = 2 j 2 for th passive oxide formed at 1.43 V vs. RHE in pH 8.4 borate and pH 3.1 phosphate solution for 1 h. The Ni was calculated from multi-wavelength ellipsometry with the film thickness. Reprint from T. Ohtsuka, K. Azumi, and N. Sato , A spectroscopic Property of the Passive Film on Iron by 3-parameter Reflectometry , Denki Kagaku, 51 (1983) 155, Copyright 1983 with permission from The Electrochemical Soc. of Japan. Figure 24. Spectra of complex refractive index, 7 2 = 2 j 2 for th passive oxide formed at 1.43 V vs. RHE in pH 8.4 borate and pH 3.1 phosphate solution for 1 h. The Ni was calculated from multi-wavelength ellipsometry with the film thickness. Reprint from T. Ohtsuka, K. Azumi, and N. Sato , A spectroscopic Property of the Passive Film on Iron by 3-parameter Reflectometry , Denki Kagaku, 51 (1983) 155, Copyright 1983 with permission from The Electrochemical Soc. of Japan.

See other pages where Spectroscopic ellipsometry solution is mentioned: [Pg.97]    [Pg.674]    [Pg.1623]    [Pg.38]    [Pg.796]    [Pg.129]    [Pg.154]    [Pg.254]    [Pg.64]    [Pg.209]    [Pg.113]    [Pg.154]    [Pg.292]    [Pg.88]    [Pg.315]    [Pg.62]    [Pg.312]    [Pg.576]    [Pg.101]    [Pg.257]    [Pg.310]    [Pg.461]    [Pg.322]   
See also in sourсe #XX -- [ Pg.312 , Pg.313 ]




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Ellipsometry

Spectroscopic ellipsometry

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