Spectroscopic complex dielectric function

Spectroscopic dlipsometry is sensitive to the dielectric functions of the different materials used in a layer stack. But it is not a compositional analytical technique. Combination with one of the compositional techniques, e. g. AES or XPS and with XTEM, to furnish information about the vertical structure, can provide valuable additional information enabling creation of a suitable optical model for an unknown complex sample structure. 

Fig. 1 UV-spectroscopically derived association constant (K, ) of pyridine-l2 complex as a function of the solvent dielectric constant (e). The red data points were reported by Bashkar and Singh [19] and the blue ones by McKinney et al. [18]. Data points n-heptane (e 1.92), n-hexadecane (e 2.05), carbon tetrachloride (e 2.24), benzene (e 2.27), p-xylene (e 2.30), toluene (e 2.38), 1,1,2,-trifluoro-trichloroethane (e 2.41), chloroform ( 4.81), m-dichlorobenzene (e 5.00), dichloromethane (e 8.93), o-dichlorobenzene (e 9.93), and 1,2-dichloroethane (e 10.36)...

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