Spatially resolved electron energy loss

Browning, N. D., Moltaji, H. O., and Buban, J. P. (1998 ). Investigation of three-dimensional grain-boundary structure in oxides through multiplescattering analysis of spatially resolved electron-energy-loss spectra. Phys. Rev. B 58, 8289-300. 

Gu, H., Shinoda, Y., and Wakai, F., Detection of boron segregation to grain boundaries in silicon carbide by spatially resolved electron energy-loss spectroscopy , J. Am. Ceram. Soc., 1999, 82, 469-72. 

Gu, H., Ceh, M., Stemmer, S., Miillejans, H. and Ruhle, M., (1995), A quantitative approach for spatially resolved electron-energy-loss spectroscopy of grain boundaries and planar defects on a subnanometer scale , Ultramicroscopy, 59 (1/4), 215-227. 

In many materials problems, for example at surfaces or interfaces, the chemical composition and nuclear coordinates are not fully known. Indeed, any information which can be obtained by theory on these basic structural properties will be useful, in conjunction with experiment. Spatially Resolved Electron Energy Loss Spectroscopy (SREELS), X-ray near-edge absorption (XANES) and emission, Mossbauer spectra, etc. provide site-specific probes which can be combined with theory to help resolve structures. 

Most surface studies have been carried out on M0S2 and its promoted analogs. In contrast to isotropic sulfides, crystals of layered sulfides are easier to grow but are very thin. Most importantly, Salmeron and co-workers showed that the basal plane was relatively inert by physical adsorption studies of thiophene at low pressure (126). Spatially resolved electron energy-loss spectroscopy (SREELS) has also been achieved on M0S2 platelets showing an enhancement of surface plasmon modes at corners and edges (127). The surface plasmon presumably is associated with the active sites. 

Cabioc h et al. developed a method based on carbon ion implantation into a metal matrix (Ag, Cu), resulting in onions with typical diameters in the 3-15 nm range. Snfficient quantities could be produced for investigation of their optical, electronic, and tribological properties. Fourier transform infrared (FTIR) spectroscopy measurements on these carbon onions demonstrated that the most stable state for the onions consists of concentric spheres of fnllerenes. The electronic properties of the onions were characterized by spatially resolved electron energy loss spectroscopy (EELS) in transmission, and reflection mode. ... 

Kodak, M., Henrard, L., Stephan, O., Suenaga, K., Colliex, C., 2000, Plasmons in layered nanospheres and nanotubes investigated by spatially resolved electron energy-loss spectroscopy, Phys. Rev. B 61,... 

Y.-G. Lu, S. Turner, J. Verbeeck, S.D. Janssens, K. Haenen, G. Van Tendeloo, Local bond length variations in boron-doped nanociystalline diamond measured by spatially resolved electron energy-loss spectroscopy. Appl. Phys. Lett. 103(3), 032105 (2013)... 

The chemical composition of the IF phase deviates only very slightly, if at all, from the composition of the bulk layered compound. Deviations from stoichiometry can only occur in the cap of the nanotube. In fact, even the most modem analytical techniques, like scanning probe techniques and high (spatial) resolution electron energy loss spectroscopy, are unable to resolve such a tiny deviation from the stoichiometry, like the excess or absence of a single Mo (W) or S (Se) atom in the nanotube cap. 

The trend which arises from a consideration of Eq. (17.2) is that the lower the value of the Hamaker constant, A, the higher the equilibrium film thickness (Clarke, 1987). Striking confirmation experimentally of such a trend has come from work in which the local Hamaker constants in silicon nitride ceramics have been determined from spatially resolved-valence electron energy-loss spectroscopy (French et al 1998). Conversely, if A is too large, then there will be no thickness Z for which Eq. (17.2) is satisfied. 

French, R.H., Miillejans, H., Jones, D.J., Duscher, G., Cannon, R.M. and Ruhle, M. (1998), Dispersion forces and Hamaker constants for intergranular films in silicon nitride from spatially resolved-valence electron energy loss spectrum imaging , Acta Mater., 46 (7), 2271-2287. 

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