Small-angle XRD patterns

Figure 6. Small angle XRD patterns of the sample CPN-2 calcined at different temperatures...

The effect of PEG on thermal stability of the mesostructured Ce02 powders has been observed by comparing the difference of properties between the samples CPN-2 and CN. Figure 10 shows the small angle XRD patterns of the samples CPN-2 and CN. After calcination at 673K, the low-angle diffraction peak in the XRD pattern of CN disappeared, but still existed in that of CPN-2. This may be attributed to the thermal stability improvement deriving from non-ionic surfactant PEG. 

Fig. 50 Small angle XRD pattern of the anodically grown WO3 film obtained in NMF/water 8/2 + NH4F 0.05%...

Figure 5-24. Calculated small angle XRD patterns, /(q) x 5 (q), in the a) xz-plane and b) the yz-plane for perfect biaxial order. Figure reprinted with permission from Bharat R. Acharya, Andrew Primak, and Satyendra Kumar, Phys. Rev. Lett., 92, 145506 (2004). Copyright 2004 American Physical Society...

Fig. 3. Crystalline evolution of triacylglycerols in fat globules of cream. Three-dimensional plots of small- (A) and wide- (B) angle XRD patterns, recorded simultaneously with differential scanning calorimetry (DSC) experiments during heating of cream at 2 C/min from -8 to 50°C. See Figure 1 for other abbreviation.

The XRD pattern of a powdered sample is measured with a stationary X-ray source (usually Cu Ka) and a movable detector, which scans the intensity of the diffracted radiation as a function of the angle 2 6 between the incoming and the diffracted beams. When working with powdered samples, an image of diffraction lines occurs because a small fraction of the powder particles will be oriented such that by chance a certain crystal plane is at the right angle 6 with the incident beam for constructive interference (see Fig. 6.1). 

The X-ray diffraction (XRD) measurements for 7a have been performed to examine the relationship between the photoluminescent properties and the self-assembled structures (Fig. 9). The XRD pattern of 7a in the Sm3 phase shows several diffractions in the small angle region, corresponding to (100), (200), (300), (400), and (500) reflections. The layer spacing is similar to the molecular length calculated to be 82 A. It is assumed that monolayer self-assembled structures are formed in the Sm3 phase (Fig. 9, top). In the SmA phase, only one peak appears at 38.2 A in the diffraction pattern obtain at 120 °C. The layer spacing is less than half... 

Produced by the EW technique CNM were subjected to investigation using XRD analysis, electron microscopy, and mass-spectrometer analysis. The typical XRD patterns for the exploded materials in different conditions are shown in Fig. 1 and Fig. 2. It is immediately obvious that there is a presence of additional diffraction peaks at small angle values besides those typical for common graphite. This fact clearly demonstrates the appearance of new structural compositions in the synthesis products. A phase analysis performed shows that these diffraction peaks correspond to those for carbonic spatial materials with the fullerene-like structure of the C60-C70 types. 

Mesoporous silicate molecular sieves were characterized by an arsenal of techniques including XRD, SEM, TEM, adsorption measurements, Si NMR, IR, Raman and XANES. XRD patterns of all nanoporous phases are dominated by low angle peaks. Figure 11 shows typical patterns for MCM-41, MCM-48, MCM-50 and SBA-2 phases. HMS, MSU-n and some "MCM-41" exhibit only the 100 peak either because of too small scattering domain sizes [69] or because of poorly ordered pore system [55,72,80]. 

Fig.1. Small- and wide- (insert) angle X-ray diffraction (XRD) patterns recorded at -8°C after quenching of the samples of cream (thick line) and anhydrous milk fat (thin line) from 50°C.

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