Single atom positioning technique

The atom probe field-ion microscope (APFIM) and its subsequent developments, the position-sensitive atom probe (POSAP) and the pulsed laser atom probe (PLAP), have the ultimate sensitivity in compositional analysis (i.e. single atoms). FIM is purely an imaging technique in which the specimen in the form of a needle with a very fine point (radius 10-100 nm) is at low temperature (liquid nitrogen or helium) and surrounded by a noble gas (He, Ne, or Ar) at 10 -10 Pa. A fluorescent screen or a... 

X-Ray diffraction from single crystals is the most direct and powerful experimental tool available to determine molecular structures and intermolecular interactions at atomic resolution. Monochromatic CuKa radiation of wavelength (X) 1.5418 A is commonly used to collect the X-ray intensities diffracted by the electrons in the crystal. The structure amplitudes, whose squares are the intensities of the reflections, coupled with their appropriate phases, are the basic ingredients to locate atomic positions. Because phases cannot be experimentally recorded, the phase problem has to be resolved by one of the well-known techniques the heavy-atom method, the direct method, anomalous dispersion, and isomorphous replacement.1 Once approximate phases of some strong reflections are obtained, the electron-density maps computed by Fourier summation, which requires both amplitudes and phases, lead to a partial solution of the crystal structure. Phases based on this initial structure can be used to include previously omitted reflections so that in a couple of trials, the entire structure is traced at a high resolution. Difference Fourier maps at this stage are helpful to locate ions and solvent molecules. Subsequent refinement of the crystal structure by well-known least-squares methods ensures reliable atomic coordinates and thermal parameters. 

From a single crystal, it is possible to measure the position and intensity of the hkl reflections accurately and from this data determine not only the unit cell dimensions and space group, but also the precise atomic positions. In most cases, this can be done with speed and accuracy, and it is one of the most powerful structural techniques available to a chemist. 

In addition to identifying and characterizing known crystalline phases, single crystal, and more recently, powder diffraction methods can be used to determine the atomic positions within the crystal structures of new and uncharacterized materials. An excellent demonstration of how XRD structure determination methods can be applied in concert with other characterization techniques for... 

Single-crystal x-ray studies of the contact-ion pair complexes shown in Table II have been completed. The data were measured with a Picker automated diffractometer, and the structures were solved by direct methods. Hydrogen atom positions were included in all the structures but usually not refined. Refinements of the structures were made using a full-matrix, least-squares technique with neutral-atom scattering factors. 

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