Silicon area of the 2.5-D implementation

From the silicon area perspective, the MCM scheme is similar to the 2.5-D scheme except the following 2 factors. 

High test cost due to die carriers Due to the difficulty of test access, 

MCMs often needs very expensive die carriers to achieve high fault coverage. In this work, the carrier cost as well as the extra test preparation time is modeled as having a cost equal to a testing time of 60 seconds1321. As a result, the silicon area of MCM can be computed as  

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Figure 2.2 Silicon area of the 2.5-D implementation with 4 slices of chips...

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