Sharp. Philip

Figure 1. Test micrograph showing the displacement of the unscattered beam (small dots) in the selected area diffraction (SAD) pattern when it occurs in polar coordinates (Philips EM 300). The tilt has been fixed at the 002 Bragg angle for carbon ( 0.3°) and the azimuth changed by small increments. The 000 spot displaces along a practically perfect circle which corresponds to the 002 Debye Scherrer ring. Such a device allows exploration of any position in the SAD pattern, even when neither sharp nor intense hkl reflections are visible. The SAD pattern of an asphaltene heat-treated at 500°C has been superimposed to the test micrograph. Various positions of a 0.13 A aperture are shown.

WILLIAM F. POWERS, NAE, Ford Motor Company (retired), Ann Arbor, Michigan EDWARD S. RUBIN, Carnegie Mellon University, Pittsburgh, Pennsylvania MAXINE L. SAVITZ, NAE, Honeywell, Inc. (retired), Los Angeles, California PHILIP R. SHARP, Harvard University, Cambridge, Massachusetts ROBERT W. SHAW, JR., Arete Corporation, Center Harbor, New Hampshire SCOTT W. TINKER, University of Texas, Austin... 

Philip Sharp, VP-Oper./Mgr.-Resident Jim O Casek, Mgr.-Finance Roger Dickson, VP-Commercial Oper. 

Handler,L., RegulatingPharmaceuticalPrices and Corporate R D Strategies in Britain and France, Strategies for New Technology-Case Studies From Britain and France, M. Sharp and P. Holmes (eds.)(New York, NY Philip Allan, 1989). 

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