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Semiconducting atomic force microscopy

In situ Studies of Conducting and Semiconducting Poiymers Eiectrochemicai Atomic Force Microscopy (EC-AFM) and Eiectrochemicai Scanning Tunneiing Microscopy (EC-STM)... [Pg.128]

C. lonescu-Zanetti, A. Mechler, S.A. Carter, and R. Lai, Semiconductive polymer blends Correlating structure with transport properties at the nanoscale. Adv. Mater., 16, 385 (2004). A. Alexeev, J. Loos, and M.M. Koetse, Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy. Ultramicroscopy, 106, 191 (2006). [Pg.154]

See other pages where Semiconducting atomic force microscopy is mentioned: [Pg.688]    [Pg.829]    [Pg.45]    [Pg.515]    [Pg.48]    [Pg.101]    [Pg.102]    [Pg.107]    [Pg.109]    [Pg.220]    [Pg.296]    [Pg.56]    [Pg.307]    [Pg.75]    [Pg.428]    [Pg.7]    [Pg.54]    [Pg.10]    [Pg.276]    [Pg.390]    [Pg.156]    [Pg.180]   
See also in sourсe #XX -- [ Pg.174 ]



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