SEELFS fine structure

SEELFS (surface extended energy loss fine structure) yes 2 0.2... 

Fine structure extending several hundred eV in kinetic energy below a CEELS peak, analogous to EXAFS, have been observed in REELS. Bond lengths of adsorbed species can be determined from Surface Electron Energy-Loss Fine Structure (SEELFS) using a modified EXAFS formalism. 

M. De Crescenzi. Phys. Rev. Letts. 30,1949,1987. Use of surface electron energy-loss fine structure (SEELFS) to determine oxygen-nickel bond length changes for oxygen absorbed on Ni (100) on a function of coverage from 0 to 1.0 monolayer. 

A core hole is excited as in fine - structure techniques (see EXAFS, SEXAFS, ARPEFS, NPD, APD, EXELFS, SEELFS)... 

SEELFS Surface Electron Energy Loss Fine Structure... 

A fine structure technique similar to EXELFS, except the incident electron energies are 100-3000 eV. SEELFS is surface sensitive because of the lower excitation energy. 

A more surface-sensitive version of EX-AFS where the excitation cross-section fine structure is monitored by detecting the photoemitted electrons (PE-SEX-AFS), Auger electrons emitted during core-hole decay (Auger-SEXAFS), or ions excited by photoelectrons and desorbed from the surface (PSD-SEX-AFS). A compilation of surface structures determined using SEELFS and SEXAFS summarizing the pre-1990 literature appears in reference 123. 

P.R. Watson. Critical Compilation of Surface Structures Determined by Surface Extended X-Ray Absorption Fine Stmcture (SEXAFS) and Surface Extended Electron Energy Loss Spectroscopy (SEELFS). J. Pins. Chem. Ref Data 21 123 (1992). 

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