Sample configuration mounting methods

There are different ways to mount the test specimen, and there are different specimen sizes and preparation methods. The different sample mounting configurations for the Izod and Charpy tests are shown in Figure 1.28. Figure 1.29 shows the details of the notch. The sharpness of the bottom of the notch affects the test result. Table 1.11 shows the different notch radii possible. 

Fig. 1 shows the Kretschmann configuration of the attenuated total reflection (ATR) method. The ATR method was reported in previous papers [l]-[6]. An Ar laser beam at 488.0 nm was used to excite SPs on metal thin films in this measurement and the p-polarized beam was directed onto the samples on the substrates through the half-cylindrical prism. The prism was mounted on a rotating stage. The incident angles of the laser beam were scanned using a computer-controlled pulse motor. The reflected intensities of the laser light, that is, the ATR... 

A stress-strain ellipse can be traced for sinusoidal deformations of a hard solid with the methods described previously after suitable modifications in the sample mounting. For example, the versatile apparatus of Philippoff described in Chapters 5 and 6 can be further modified for measurements of hard solids in flexure, using a configuration similar to that of (c) in Fig. 7-1. Configuration (a) is used by Koppelmann. The calculation of dynamic properties from equation 1 with both / and X2 sinusoidally varying is analogous to equations 19 and 20 of Chapter 5, except that now the two components of Young s modulus are determined ... 

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