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Reflected light, polarization

Figure 10.1 Comparisons of visible to near-infrared spectra of calcic pyroxene in transmitted and reflected light. Polarized absorption spectra of single crystals are correlated with the reflectance spectrum of a powdered sample of the same mineral (cf. fig. 5.14). Figure 10.1 Comparisons of visible to near-infrared spectra of calcic pyroxene in transmitted and reflected light. Polarized absorption spectra of single crystals are correlated with the reflectance spectrum of a powdered sample of the same mineral (cf. fig. 5.14).
Optical Microscopy. Optical microscopy involves the use of transmitted light, reflected light, polarized light, fluorescence, and more recently, techniques such as confocal microscopy. Each of these variations has particular strengths and applicability. [Pg.104]

Fig. 3—Measurement of surface by HDI surface reflectance analyzer. In electromagnetic radiation (light), the polarization direction is defined as the direction of the electric field vector. The incident polarization of the light can be controlled. The instrument uses a variety of detectors to analyze the reflected polarization state of the light. (U.S. Patent 6,134,011). (a) Plane of the disk The SRA uses a fixed 60 degree (from the surface normal) angle of incidence. The plane of incidence is the same as the paper plane (b) Pit on a surface detected by reflected light channels of HDI instrument (c) Scratches on disk surface measured by HDI surface reflectance analyzer (d) Particles on the surface of disk detected by reflected light (black spot) and by scattered light (white spot) [8]. Fig. 3—Measurement of surface by HDI surface reflectance analyzer. In electromagnetic radiation (light), the polarization direction is defined as the direction of the electric field vector. The incident polarization of the light can be controlled. The instrument uses a variety of detectors to analyze the reflected polarization state of the light. (U.S. Patent 6,134,011). (a) Plane of the disk The SRA uses a fixed 60 degree (from the surface normal) angle of incidence. The plane of incidence is the same as the paper plane (b) Pit on a surface detected by reflected light channels of HDI instrument (c) Scratches on disk surface measured by HDI surface reflectance analyzer (d) Particles on the surface of disk detected by reflected light (black spot) and by scattered light (white spot) [8].
FIGURE 27.24 Reflection of polarized light. The plane of incidence is defined by the incident and reflected beam. The and p components are indicated for the incident light, with the electric vector normal and parallel, respectively, to the plane of incidence. (From Muller, 1973, with permission from Wiley-VCH.)... [Pg.492]

The reflected light from polished surfaces permits ready distinction between many opaque minerals on the basis of brightness, colour, and anisotropy. This feature is very important in the study of ore minerals and host rocks. Transparent minerals (especially in rocks) are commonly studied by transmitted light. In this case, polarized light is passed through thin sections or through fragments mounted in oil. [Pg.56]

The problem of solvent absorption can be overcome by measuring the change in reflectivity of the electrode either by (a) modulating the state of light polarization between p-polarized and s-polarized radiation, or (b) using p-polarized radiation and taking spectra at two different electrode potentials. [Pg.135]

Since adsorbed molecules are exposed both to the incident and reflected light waves whose electric field amplitudes are interrelated by the Fresnel formulae, the vectors in s- and -polarizations appear as ... [Pg.59]

One of the key experimental results leading to the elucidation of this overall structural puzzle involved depolarized reflected light microscopy (DRLM) studies on NOBOW freely suspended films in the high-temperature SmCP phase.48 In the freely suspended films it appears that only one phase is observed, which is assumed to be the phase forming the majority domains in the EO cells. The DRLM experiment provides two key results. First, thin films of any layer number have a uniformly tilted optic axis, suggesting all of the layer interfaces are synclinic. Second, films of even-layer number are nonpolar, while films of odd-layer number are polar, with the polar axis oriented normal to the plane of the director tilt (lateral polarization). [Pg.496]


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