Reflected light microscopy specimen preparation method

Replication is one of the oldest methods used for the production of thin TEM specimens and it is also used for specimen preparation for optical microscopy and SEM. The procedure was first introduced by Bradley [426, 427], and it is well documented in texts on specimen preparation [428, 429]. Replicas have the surface characteristics or topography of the original specimen without the need to directly image beam sensitive materials. Reflected light microscopy of polymer surfaces is often difficult because glare from the surface limits visible detail, although... 

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