Quartz high-pressure water clusters

Figure 9.13. BF image (g = lOTl) of the dislocation tangles generated at the high-pressure water clusters in wet synthetic quartz deformed at a constant strain-rate at 475°C. (From McLaren et al. 1989.)...

The 3-/im infrared absorption band in wet synthetic quartz is due to high-pressure clusters of molecular water rather than point defects (Aines and Rossman 1984 Gerretsen et al. 1989). 

Figure 9.7. BF micrographs showing the strrun associated with high-pressure clusters of molecular water in as-grown wet synthetic quartz (crystal W2). (a) Region with a water content corresponding to 2(X)H/10 Si. (b) Region with l,600H/10 Si. No strain is associated with the arrowed clusters because they intersect the foil surface the water escapes, and the stress is relaxed. The strmn field of the circled cluster is characteristic of a lens-shaped inclusion whose plane is normal to the foil surface. (From McLaren et al. 1983.)...

Since Morrison-Smith et al. (1976) associated the strain features observed in these specimens (Figure 9.7) with acmite inclusions and not with high-pressure clusters of molecular water, they did not relate dislocation nucleation with the water in wet synthetic quartz. 

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