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Processing Effects on Order Domain Size

The growth of an ordered colloidal structure is similar to that of the growth of a crystal. In this case, the rate at which particles arrive at [Pg.529]

5 Measurement of Ordered Domain Size by Light Diffraction [Pg.530]

Diffraction line broadening has been adapted to light diffraction to measure ordered domain size by Chang and Ring [56]. The first treatment of diffraction line broadening was by Scherrer [57], who derived the equation [Pg.530]

In addition, diffraction line breadth contains information on lattice strain, lattice defects, and thermal vibrations of the crystal structure. The chief problem to determine crystallite size from line breadth is the determination of /3(20) from the diffraction profile, because broadening can also be caused by the instrument. To correct for the instrumental broadening on the pattern of the sample, it is convenient to run a standard peak from a sample in which the crystallite size is large enough to eliminate all crystallite size broadening. By use of a convolu- [Pg.530]

6 Effect of Ordering and Domain Size on Ceramic Processing [Pg.531]


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