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Process IR Instrumentation

It takes a lot more than just connecting an IR instrument to a pipe to make the instrument into a process analyzer. The system not only has to be constructed correctly and be capable of flawless operation 24 hours a day, but it also has to be packaged correctly, and be able to access the stream correctly and without any interference from process-related disturbances such as bubbles, water, particulates, etc. Finally, the data acquired from the instrument has to be collected and converted into a meaningful form and then transmitted to the process computer, where the information is used to assess the quality of the product and to report any deviations in the production. Beyond that point, the process computer, typically not the process analyzer, handles any decisions and control issues. There are a few exceptions where robotics are integrated with the analyzer, and good vs. bad product quality are assessed at the point of measurement. The use of [Pg.100]

FTIR analyzers for semiconductor wafer quality testing is an example, as mentioned below. Today we speak of process analytical instrumentation (PAI), and we use the term PAI which relates to the totally integrated system, implemented on-line, and made up of some or all of the following components. [Pg.101]


See other pages where Process IR Instrumentation is mentioned: [Pg.166]    [Pg.100]   


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