Poly , static SIMS

The use of static SIMS for the characterization of surfaces of polypropylene (PP), PTFE and a PMDA-ODA type poly-imide is described. Interfaces between evaporated copper or chromium films onto PTFE and polyimide were also analyzed. Some of the polymer substrates were modified by ion beams, corona discharge in air or plasma treatments in air, At and H2. It is demonstrated that SIMS is highly complementary to XPS for the analysis of such modified surfaces, in that effects such as crosslinking, unsaturation and formation of low-molecular weight material at surfaces can be detected. 

Poly(ethylene terephthalate) semicrystalline films have been metallized with Al and Cu by using Knudsen effusion cells. During the metal deposition, the surface was characterized by static SIMS. The secondary ions characteristics of the polymer and the new contributions produced by the metal and metal-polymer fragments were followed as a function of the deposition time. It is observed that the binetlcs is very different for the two metals it is faster for Al as compared to Cu. After an Al deposition... 

Static SIMS is capable of obtaining very reproducible fingerprint spectra from bulk polymer surfaces. For example, static SIMS can easily distinguish between poly(methyl methacrylate) (PMMA) and the structurally similar poly(ethyl methacrylate) (PEMA) (Figure 9) based upon the unique negative ion fragmentation pattern obtained from each polymer. PEMA has a monomer repeat unit mass of 114 amu ... 

Figure 5.23 Static SIMS mass spectra collected from poly-L-lysme resulting from (a) lOkeV Cs" primary ion impact and (b) the application of the G-SIMS approach utilizing signals recorded from lOkeV Cs and Ar primary ion impact. As noted, the strong fragmentation suffered under lOkeV Cs" primary ion impact alone is completely removed making visible the side chain, and the dimer repeat are clearly revealed (the Br salt is part of the subshate). Reprinted with permission from Gilmore and Seah (2003) Copyright 2003 American Chemical Society.

Samuel, N.T.,Wagner, M.S., Dornfeld, K.D., Castner, D.G. (2001) Analysis of poly(amino acids) by static time-of-flight secondary ion mass spectrometry (TOF-SIMS). Surf ScL Spectra, 8,163-185. 

Because ablation is carried ont at high temperatures it is possible to examine thermally static polymers snch as poly-p-methylstyrene. Other recent applications of ToF-SIMS include the examination of PS [182-184], PE [185], carbon fibre-reinforced epoxy resins [186], polyalkylacrylates [187], alkylketene dimers [188], perfluorinated polymers [189],... 

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