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Poly -copper interface

Characterization of the Poly(ether ether ketone)—Copper Interface... [Pg.370]

The use of static SIMS for the characterization of surfaces of polypropylene (PP), PTFE and a PMDA-ODA type poly-imide is described. Interfaces between evaporated copper or chromium films onto PTFE and polyimide were also analyzed. Some of the polymer substrates were modified by ion beams, corona discharge in air or plasma treatments in air, At and H2. It is demonstrated that SIMS is highly complementary to XPS for the analysis of such modified surfaces, in that effects such as crosslinking, unsaturation and formation of low-molecular weight material at surfaces can be detected. [Pg.60]

See other pages where Poly -copper interface is mentioned: [Pg.279]    [Pg.181]    [Pg.61]    [Pg.142]    [Pg.768]    [Pg.26]    [Pg.63]    [Pg.127]    [Pg.351]    [Pg.271]    [Pg.2032]    [Pg.337]    [Pg.71]    [Pg.75]    [Pg.389]    [Pg.136]    [Pg.423]    [Pg.281]   


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