Photoemission, schematic representation

Figure 1 Schematic representation of the three techniques (a) x-ray photoabsorption (NEXAFS/SEXAFS), (b) photoelectron spectroscopy (photoemission) and (c) photoelectron diffraction.

Figure 14.1 QD-MBP-dye nanoassembly, (a) Schematic representation of the QD-MBP-dye nanoassembly used (not drawn to scale). The distance r represents the average distance between the QD center and the Cy3-labeled residue on MBP. (b) Normalized absorption spectra of Cy3 dye and photoemission spectra of three CdSe-ZnS core-shell QD solutions demonstrating the ability of tuning the spectral overlap of the QD with a given dye acceptor. Adapted from reference 28 and reprinted by permission of the American Chemical Society.

Figure 2-1. Schematic representations of (1) the photoconduction, (2) the photoemission, and (3) the optical absorption processes...

Fig. 8. Schematic representation of the physics of a photemission process considering core levels and valence states. A A free atom in its ground state B the atom in a solid C effect of core-hole relaxation on the position of core level lines and D the relationship of an observed spectrum and the position of the boimd states from which the photoemission occurred...

Fig. 17.3 Schematic representation of the initial state effect in small particle photoemission.

Fig. 8 Schematic representation of partial yield photoemission spectroscopy.

Fig. 4. Schematic representation of the principle of the different core level spectroscopies. Lower part (See caption of fig. 3.) (a) and (b) SXE soft X-ray emission, (a) and (c) AES Auger electron spectroscopy, (d) XPS X-ray photoemission spectroscopy, (e) SXA soft X-ray absorption, (f) EELS electron energy loss spectroscopy. Upper part (See caption of fig. 3.) Half-filled rectangle excited final state with the same electron count as in the initial state, (e), (f). Divided rectangle final state with two electrons less than in the initial state (see also fig. 19b).

Fig. 22. Schematic representation of the Kondo picture of the spectral density of a Ce impurity in an electron gas. The region below Ep can be studied by photoemission and the region above pis accessible to BIS.

Fig. 3A-C. Representations of the differential-charging effect. A Heterogeneous sample consisting of conducting base (black) and a structured insulating surface (grey). The arrows depict schematically current trajectories for different spots of the sample denoted by the indices 1,2, 3 (11,12,13 - emitted currents). Due to different resistance properties, different potentials Ui, U2, U3 arise. B Electrical equivalence diagram for a sample under constant irradiation. C Effect of differential charging on the position of the energy scale of the photoemission experiment...

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