Photoelectron sample holder peaks

X-ray photoelectron spectroscopy (XPS) measurements were performed using a SSX-100 model 206 Surface Science Instrument Spectrometer operated at 10 kV, 12 mA with a monochromatized A1 Ka radiation (1486.6 eV). The catalysts were pressed into the samples holders of 6 mm and then introduced into the preparation chamber of the spectrometer. The Cu, Mosd, Co2p, Niap and Ou lines were recorded for each sample. All binding energies were referenced to the Cu level at 284.8 eV. Surface composition was determined from the peak intensities and the Scofield sensitivity factors provided by the instrument software. For spectrum deconvolution, a Shirley baseline was used and peaks were considered Gaussian/ Lorentzian ratio of 85/15. 

X-ray photoelectron spectra (XPS) of catalysts were recorded using a Leybold Heraeus LHS-11 apparatus equipped with a computer system, which allowed the determination of peak areas. The excitation radiation was the Alka line (E = 1486 eV). All the samples were grounded and then pressed into the sample holders before the analysis. Signals corresponding to Al2p, Al s °3p" 2p 2s levels were recorded. The energy... 

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