Palladium nuclear properties

Elaborate synthetic approaches have been developed that enable significant control over the size and shape of palladium nanostructures. In order to understand the properties of the materials formed based on the preparation method, several characterization techniques have been used. These include electron microscopy, scanning probe microscopy (SPM), nuclear magnetic resonance (NMR) spectroscopy, ultraviolet-visible (UV-Vis) spectroscopy, infrared (IR) spectroscopy, electrochemistry, X-ray diffraction (XRD), thermogravimetric analysis (TGA), electron diffraction, photoelectron spectroscopy, dynamic light scattering (DLS), extended X-ray absorption fine structure (EXAFS), BET surface area analysis andX-ray reflectivity (XRR). In the following section we will describe the information provided by each of these characterization techniques. 

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