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Optothermal transient emission radiometry

In optothermal transient emission radiometry a sample material is irradiated (excited) with optical wavelength radiation in the form of short-duration pulses and the thermal emission transient observed by means of a wide-band infrared detector (Figure 6.32). An optothermal decay curve plots the intensity of the thermal emission versus time. The shape of the decay curve depends upon the extent to which the incident radiation penetrates into the sample, as well as on the thermal diffiisivity and transparency to the emitted thermal infrared of the material. [Pg.154]

Schematic illustration of an optothermal transient emission radiometry (OTTER) apparatus... Schematic illustration of an optothermal transient emission radiometry (OTTER) apparatus...
In response to criticism from members of the electronics industry that thermal analysis methods are often incompatible with the rapid pace of corporate research development, new sections have been introduced on thermally stimulated current spectroscopy, thermal conductivity, optothermal transient emission radiometry and micro-thermal analysis (/ TA). [Pg.183]


See other pages where Optothermal transient emission radiometry is mentioned: [Pg.6]    [Pg.154]    [Pg.6]    [Pg.154]   


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