N Is spectra

Figure 5. X-ray photoelectron survey spectrum (a) of an o-phenylenedlamlne derlvatlzed glassy carbon surface. High resolution C Is and N Is spectra of a derlvatlzed surface (b) and surface which was derlvatlzed following reduction with lilAlH to destroy surface o-qulnone functional groups (c). The spectrum were signal averaged for 90 min (a) and 20 min (b and c) and smoothed prior to display.

Main group element analysis was carried out with a Perkin-Elmer CHN elemental analyzer, while molybdenum analysis was performed using atomic absorption spectroscopy. The content of Mo and O on the surface of the catalysts was obtained by X-ray photoelectron spectroscopy (XPS) using a Shimazu ESCA-850 spectrometer with monochromatic MgKa. Since Mo 3p3/2 spectra overlapped with the N Is spectra for the nitrided catalysts, the degree of nitriding (N IsfMo 3d ratio) had to be obtained from a combination of elemental analysis and XPS. 

Figure 25.3 N Is spectra recorded from TiN(lOO) at three different photon energies (dots). The solid curves represent the results of a curve fitting procedure.

Benzene-phthalimide (BPIM). The C Is, 0 Is and N Is spectra of BPIM on Cu are shown in Figure 4. The lower spectra corresponding to a thin film of BPIM are similar to those of a thin film of PIM, except for a relatively smaller carbonyl carbon peak as expected. 

Figure 3. The N-Is spectra for cured Skybond 703 and PI5878 polyimides...

Fig. 5.8 Evolution ofXPS N Is spectra of F8BT with different Ca concentration.

Fig. 5.13 Evolution ofXPS N Is spectra of F8BT with different Cs concentration up to 10.5%. The spectra of 10.5% Cs/F8BT film deposited with 0.5 and 6.5 A of Ag and the latter film exposed with residual gases at a background pressure of 2 X 1CT9 mbar for 12 h are shown in the top three curves.

Figure 3. XPS C Is and N Is spectra of Ti02 substrates homogenously coated with PFAND and ND, respectively (obtained with PHI5000). C1-C7 and N1-N4 are curve-fitted carbon and nitrogen components (details in Table 2).

Figure 6. XPS spectra of (a) N (Is) spectra showing nitrided nitrogen at 396 eV, whereas no peak existed in the range of 400.8 0.3 eV and (b) A1 (2p) peak at 74 eV.

Cyclohexylamine, pyridine, and triethyl-amine were studied on mild steel in 0.5 M H2SO4 by electrochemical impedance spectroscopy and XPS. Comparison of N (Is) spectra between active and passive regions showed that adsorption is significant only in the passive region. Two chemically distinct adsorbed amine species were detected in the experiment. The nature of the metal surface can be determinative of the performance of the inhibitors. 

Figure 11 N Is spectra for austenitic stainless steels (a) As nitrided (b) follow polarization from open circuit to 0 mV. Sweep rate 1 mV/s. (From Ref. 33.)...

Table 1. Atomic percentages of surface species, Ga, N, O, C, and Cl for HVPEl and HVPE2 samples with different treatments (as-received, 600° C annealing in UHV, Ar+ sputtering, and 100 sec-HF, 500 sec-FlF, and 700 sec-HNOs etching), determined by XPS intensities and sensitivity factors for Ga 3d, N Is, O Is, C Is, and Cl 2p. As shown in Figs. 2, we can estimate the component intensities of Gajv, Gao, Can-N/ artd metal-Ga from Ga 3d spectra, and those of Ngg, Nhj, and N 3 from N Is spectra. Here the sum of Ga, N, O, C, and Cl atomic-% is fixed to be 100%. Note that these values have an error of approximately 10%, e.g., 16% is 16 2%.

Fig. 11-29 XPS N is spectra (A) neutral poly(diphenylamine), (B) oxidized poly(diphenylamine),and(C)oxidizedpoly(N-phenyl-l-naphthylamine). Dashed lines are the results of deconvolution. After Reference [24], reproduced with permission.

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