Multiply charged secondary ions

The generation of large numbers of complex, poly-atomic and multiply charged ions in the sputtering process [15,16,17] creates potentially severe problems for low resolution secondary ion isotopic analysis. To minimize the formation of hydride and... 

A relatively explicit nomenclature is used to characterise the type of ions formed singly charged, multiply charged, monoatomic, polyatomic, molecular, pseudo-molecular, parent, daughter, metastable, secondary fragments, etc. 

This paper focuses on special ionization methods such as secondary ion MS (SIMS) (1, 13, 24-28) and ZCf plasma desorption (PD), and on MS/MS methods for characterizing primary ions, such as surface induced dissociation (SID), laser photodissociation, and neutralization of multiply charged ions. A Hadamard transform method for more efficient recording of multiple MS-II spectra is also proposed. 

Energy filtering removes complex molecular ions that are basically low-energy ions. It is not active, however, against other interfering ions, such as oxides, hydrides, and multiply charged ions. Moreover, it works at the expense of the intensity of secondary ions since the ion... 

The vast majority of secondary ions have a charge of +1 or -1. In these cases, the ion s mass equates to the recorded mass to charge ratio. For multiple charged ions, the mass is the mass to charge ratio multiplied by the ions charge. Thus, which has a nominal mass of 28 u, will appear at 14 miq (28/2), whereas will appear at 9.333 mjq (28/3). 

The vast majority of secondary ions are singly charged. Of the multiply charged ions, most are of a positive polarity (negative multiply charged ions have very short lifetimes). 

Kinetic emission model A model describing multiply charged atomic secondary ion emission... 

Question At what mass-to-charge ratio will multiply charged atomic secondary ions of 2 Si + and Si + be noted at... 

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