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Modulated reflectometry

A commonly used form of internal modulation is differential reflectometry, in which the reflectance of the sample under investigation (or a portion of it) is compared to a standard material. This can be accomplished either by holding the sample stationary and scanning the probe beam between two regions or by holding the l t spot fixed and moving the sample. ... [Pg.390]

See other pages where Modulated reflectometry is mentioned: [Pg.194]    [Pg.428]    [Pg.194]    [Pg.428]    [Pg.192]    [Pg.306]    [Pg.283]    [Pg.535]    [Pg.320]    [Pg.333]    [Pg.886]    [Pg.898]   


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Reflectometry

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