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MEIS medium-energy ion

Figure 1.4 Comparison of the application ranges of techniques that are sensitive to nearsurface strains. Minimum detection limits are plotted against depth resolution of the measurement. XRD X-ray diffraction DOR differential optical reflectometry. RBS Rutherford back scattering MEIS medium energy ion scattering TEM transmission electron microscopy...

$Figure 1.4 Comparison of the application ranges of techniques that are sensitive to nearsurface strains. Minimum detection limits are plotted against depth resolution of the measurement. XRD X-ray diffraction DOR differential optical reflectometry. RBS Rutherford back scattering MEIS medium energy ion scattering TEM transmission electron microscopy...$

MEIS medium-energy ion scattering/medium-energy ion scattering spectroscopy... [Pg.1028]

See other pages where MEIS medium-energy ion is mentioned: [Pg.17] [Pg.128] [Pg.205] [Pg.316] [Pg.543] [Pg.565] [Pg.595] [Pg.132] [Pg.180] [Pg.218] [Pg.1088] [Pg.989] [Pg.1141] [Pg.285] [Pg.773] [Pg.1413] [Pg.4] [Pg.989] [Pg.1382] [Pg.1410] [Pg.17]

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Energy medium

Ion energies

MEIS