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Linear region, atomic force microscopy

The method applied to measure the depth of the ablated area or the removed mass can also have an influence on the ablation parameters. If profilometric measurements (optical interferometry, mechanical stylus [34], or atomic force microscopy [35]) are used to calculate the ablation rate, a sharp ablation threshold can be defined. This is also supported by reflectivity [36] and acoustic measurements [37], In mass loss measurements, such as mass spectrometry or with a quartz crystal microbalance (QCM), the so-called Arrhenius tail [38] has been observed for certain conditions. The Arrhenius tail describes a region in the very low fluence range, where a linear increase of detected ablation products is observed, which is followed by a much faster increase, that coincides with removal rates of the profilometric measurements [39]. [Pg.543]


See other pages where Linear region, atomic force microscopy is mentioned: [Pg.117]    [Pg.35]    [Pg.512]    [Pg.512]    [Pg.248]    [Pg.24]    [Pg.8280]    [Pg.72]    [Pg.153]    [Pg.276]    [Pg.39]    [Pg.500]   


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