Leakage current measurement

IZnO(2 = actual leakage current measured at site. 

Fig. 10.8 aZTT Figure of Merit ( Eb,=CVbr/A, in gC/cmz) and leakage currents (measured at a stored charge of 7. iC/cm2, current density measured in A/cm2) as a function of position on the substrate. 

Fig. 7. Leakage current measurements on a pollution layer of fumed silica after different times for recovering the hydrophobicity.

Modeling of Triple-Track and Comb-Pattern Leakage Current Measurements... 

Electrical Measurements. DC leakage current measurements were made as a function of applied bias voltage over a range of -10 to +10 V. Data were obtained with a Keithley Model 616 Digital Electrometer. The voltage source was a battery-regulated potentiometer. 

Donaldson (9) applied water chemical potential arguments to explain lower leakage currents measured in encapsulated microelectronic devices exposed to sugar-water solutions, relative to devices exposed to pure water. The differences reported by Donaldson are smaller than those reported here, since a saturated sugar solution has less effect on the water chemical potential than a saturated CaCl2 solution. 

A.G. Papathanasiou, A.T. Papaioannou, and A.G. Boudouvis, Illuminating the connection between contact angle saturation and dielectric breakdown in electrowetting through leakage current measurements. J. Appl. Phys. 103, 034901-1-4 (2008). 

Another concern is the potential damage to gate oxide. The leakage current measurements on the gate oxide show that born carbide coating does not introduce damage to gate oxide. 

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