Layered imaging

Figure 13 FTIR ATR image of the polymer laminate (top left IR spectrum of COPA layer bottom left IR spectrum of EVA layer). The amide I absorption of COPA (top right) and the ester absorption of EVA (bottom right) were integrated (high intensities represented in bright color). An Intermediate region of ca. 5 pm (dimension bar) is assumed to be the LLDPE-MAH layer. Image area 50 pm x 50 pm.

Horgan and M. Anthony, Composite Layered Imaging Member for Electrophotography, U.S. Patent 4047948, pp. 14, (1977). 

Acidic polymer Timing Layer Image receiving layer Opacifying fluid... 

Figure 5.12. High resolution images of Ge nanowires from Korgel and coworkers. Image (a) shows an untreated Ge nanowire with a native germanium suboxide layer. Image (b) shows a Ge nanowire with a covalently bonded hexyl monolayer attached using the hydrogermylation reaction. An abrupt surface is observed. Figure adapted with permission from Ref. [103]. Copyright 2004 American Chemical Society.

Fig. 4. Representative immunofluorescence showing the localization of pAkt in sham (A—C) and ischemic (D-F) retina after 1 h of reperfusion in rat. A strong increase of pAkt immunoreactivity is detectable in the inner segment of the retina and in particular in ganglion cells (GCL) and inner plexiform (IPL) layers. Images were obtained using identical exposure time and conditions. Scale bar ...

Fig. 7.8. TEM cross-section of an undoped PLD ZnO thin film on 3C-SiC buffered Si(lll), grown at 0.016mbar O2 and 620°C. The SAD pattern (inset) was taken from the circled area. The HRTEM image (right) of the interface shows residual 3C-SiC and an amorphous interface layer. Images by G. Wagner, Leipzig...

The diffusion-layer imaging technique which was developed by McCreery is another method for studying intermediates in the diffusion layer [71-75]. A laser beam is directed in a parallel direction through the diffusion layer of the electrode and the light is then magnified and focused on a diode-array detector. With this method, spatial resolution of the diffusion layer of 1.25 pm is achieved, and concentration profiles in the diffusion layer are mapped. A detailed description of mass transport processes as well as the kinetics and spectra of intermediates can be obtained. Diffusion coefficients and extinction coefficients for, for example, the benzophenone radical anion were measured with this technique [74, 75]. 

Figure 2.18. The surface-layer imaging process. Pattemwise exposure results in radiochemical modification of only a thin surface layer of the resist (i.e., the resist film is opaque at the exposure wavelength). The surface area modified by exposure is then metalated with an appropriate organometallic reagent, and the resulting structure is dry developed by treatment with oxygen RIE.

It Imaging Layer Planarizing Layer Imaging Comments Reference... 

The features described above have been used for identification of the MCM-22 layers. Images containing the quality of detail shown in features A and B depend on well-ordered materials in near perfect orientation. The disruption caused to the material s structure by the swelling and/or pillaring process reduces the probability of observing such images in exfoliated materials. The layers in heavily exfoliated materials viewed edge-on usually resemble those shown in the features C. 

Fig. 11 Top weight changes of AZ91D alloy samples vs immersion time in Bmim-NTfr Bottom chemical composition of the sample surface determined via energy dispersive X-ray spectroscopy (EDXS) showing the buildup of a contamination layer. Image adapted from [217]. Image Copyright Wiley-VCH (2007)...

Fig. 8.31. Image processing in 3D SIMS generation of a local depth profile and a transaxial layer image (a) and of a coaxial layer image, a spatial diagonal image, and a point analytical information (b) the representation is inspired from Rudenauer [1989]...

Figu re 2.2 (a) Raw spectra of a Raman emulsion layer image (b) Spectra after de-noising by principal component analysis (PCA) (c) Spectra after de-noising and baseline correction by asymmetric least squares. 

Here, the subindex i refers to each individual constituent, and an sCi value is calculated for each constituent in each of the layers. CiS and CS are the signal contribution of the ith component and the global signal within a layer image, respectively. 

The atomic force microscope can be configured in several ways, the most obvious (contact mode) merely involving scanning the tip over the sample at regular intervals, rasper fashion, and recording the deflection. Because of the proportionately very large capillary forces that arise from a contamination layer, imaging of polysaccharides in direct contact mode is carried out under a solvent... 

The ultra-thin organie film formation on TiOj templates was effectively promoted through the speeifi-eally designed, bifunctional self-assembly molecules (SAM) 5-eyano-2-(butyl(4-phosphonie acid))-3-butyl-thiophene (CNBTPA), whereas DBQT and DBST did not improve their layer structure when they were evaporated on the SAM layer (images not shown). 

Fig. 3. Atomic force micrographs of pentacene layer deposited on Si02 at a growth rate of 0.05 nm/min. The scan size is 4 x 4 ftm2. The images correspond to pentacene layer thickness of 10 nm. Image 3(a) represents the sample where HMDS treatment was not applied prior to pentacene layer deposition. Black arrows indicate long continuous channel between metallic contact and pentacene layer where no pentacene islands are observed. White arrows indicate rifts in pentacene layer. Image 3(b) represents the sample where HMDS treatment was applied prior to pentacene layer deposition. Black arrows indicate irregularities at metal/ pentacene interface.

If we use a TEM with a point resolution near 0.2 nm, how is the mica unit layer imaged Figure 2 shows several examples. They are simulated images (the simulation method is explained below), assuming that the specimen thickness is 2.5 nm and that the imaging is at Scherzer defocus (the focusing value calculated by [ -1.2 ], where... 

Sectional view by SEM MgO layer image by EPMA Unreacted MgO image by EPMA... 

Fig. 7.5 Cross-section TEM of a Fe/V superlattice, showing well defined, smooth layers. Image taken from A. Broddefalk et al., Phys. Reu. B, 65 214430 (2002).

If spectra of surface adsorption or deposition processes are not desired in a study it may be worth considering a method in which the light beam passes parallel to the electrode surface such as LOPTLC or diffusion-layer imaging techniques. Grazing-angle laser reflection with 5 pm resolution is useful for diffusion-layer imaging. However, to some extent, diffusion-layer imaging such as this has been eclipsed by the advent of electrochemical STM techniques. 

Densitometry was first used to directly measure the amount of light absorbed by radioactive spots on films or stained protein bands on electrophoresis gels in the transmission mode. TLC slit scanners were then developed to directly measure the diffuse reflectance of colored, ultraviolet (UV) absorbing, and fluorescent zones on a layer, followed by videodensitometers for documentation and quantification of layer images. Most recendy, a commercial diode array scanner and office flatbed scanners (as purchased or modified) have been used for quantitative TLC. 

Figure 5 AFM picture of lateraify oriented silicalite-1 crystals on a Fe Oy layer, image size is 5 x 5 /im.

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