Jarvis

Jarvis S P, Yamada H, Yamamoto S-l, Tokumoto H and Pethica J B 1996 Direct mechanical measurement of interatomic potentials Nature 384 247... 

Jarvis S P, Durig U, Lantz M A, Yamada H and Tokumoto H 1998 Feedback stabilized force-sensors a gateway to the direct measurement of interaction potentials Appl. Phys. A 66 S211... 

Jarvis S P and Tokumoto FI 1997 Measurement and interpretation of forces in the atomic force microscope Probe Microscopy 1 65... 

Jarvis R A and E A Patrick 1973. Clustering Using a Similarity Measure Based on Shared Near Neighbours. IEEE Transactions in Computers C-22 1025-1034. 

Jarvis, K.E., Gray, A.L., Williams, J.G., and Jarvis, 1., Plasma Source Mass Spectrometry, The Royal Society of Chemistry, Cambridge, 1990. 

M. J. Drews, C. W. Jarvis, and G. C. Lickfield, Temay Reactions AmongPolymer Substrate—Organohalogen—Antimony Oxides Under Pyrolytic, Oxidative and Flaming Conditions, NIST-GCR-89-558, U.S. Department of Commerce, Gaithersburg, Md., 1989. 

It may be that in years to come, interatomic potentials can be estimated experimentally by the use of the atomic force microscope (Section 6.2.3). A first step in this direction has been taken by Jarvis et al. (1996), who used a force feedback loop in an AFM to prevent sudden springback when the probing silicon tip approaches the silicon specimen. The authors claim that their method means that force-distance spectroscopy of specific sites is possible - mechanical characterisation of the potentials of specific chemical bonds . 

A. W P. Jarvie, Organomet Chem. Rev., Sect A 6 153 (1970) W. P. Webei Silicon Reagents for Organic Synthesis, Springer-Verlag, Berlin, 1983 E. W Colvin, Silicon in Organic Synthesis, Butterworths, London, 1981. 

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