Intermediate range order, silicate glasses

Henderson G, Bancroft G, Fleet M, Rogers D (1985) Raman spectra of gallium and germanimn substituted silicate glasses variations in intermediate-range order. Am Mineral 70 946-960... 

X-ray photoelectron spectroscopy studies changes in the chemical state of atoms within a material and traditionally used to analyze content and chemical state of elements in thin snrface layer. An attempt has been made to expand the application area of X-ray photoelectron spectroscopy to the analysis of the atomic stracture of silicate glasses thin snrface layers. The techniqne, based on the photoelectron spectra analysis, which allows one to infer information about content and statistics of the intermediate-range order stractnral units and cross-linking degree of glass stmcture was developed. 

Herein X-ray photoelectron spectroscopy is used to obtain quantitative information about the structure of lead-silicate glasses, the content of different lead structural forms over a wide concentration range, the bonding degree of Pb-0 and Si-0 structures, and the composition and statistics of intermediate-range order structural units. 

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