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Inelastic impact

A second possible EID process is due to inelastic impact. This occurs when a fast electron, usually a primary or decay electron, collides with an electron in a molecule, leaving the molecule in an excited electronic state. This process, however, is usually not dominant because of the low number of electrons having high enough kinetic energy and because the impact cross section is lower, on the order of the absorption cross section. [Pg.290]

The relation between / h and A at B=1 has been calculated (Fig. 11.5b). It shows that the relative thinning of film during an inelastic impact (A>0.01 with h - h /3) depends even less on A than in the case of a quasi-elastic impact (A<0.01 with h h /4). [Pg.431]

It follows from (11.17) that h apK[ and that A l/ap. Therefore, we can achieve a substantial decrease of the finite thickness of the film (more than by an order of magnitude) by decreasing the particle size decreases and we enter the region of inelastic impact (A>0.01). In this case, the final energy of the particle substantially decreases and, therefore, the probability of the particle jumping back decreases while the probability of its detaching during subsequent impact increases. [Pg.431]

The energy of the particle remaining after the inelastic impact will be... [Pg.278]

The probability for a particular electron collision process to occur is expressed in tenns of the corresponding electron-impact cross section n which is a function of the energy of the colliding electron. All inelastic electron collision processes have a minimum energy (tlireshold) below which the process cannot occur for reasons of energy conservation. In plasmas, the electrons are not mono-energetic, but have an energy or velocity distribution,/(v). In those cases, it is often convenient to define a rate coefficient /cfor each two-body collision process ... [Pg.2800]

Finally, several chapters are provided which summarize the applications of shock-compression techniques to the study of material properties, and which illustrate the multidisciplinary nature of shock-wave applications. These applications include the inelastic response of materials, usually resulting from the extreme impact loads produced by colliding bodies, but also resulting from intense radiation loading. [Pg.356]

A further technique exists for the determination of triplet energy levels. This technique, called electron impact spectroscopy, involves the use of inelastic scattering of low-energy electrons by collision with molecules. The inelastic collisions of the electrons with the molecules result in transfer of the electron energy to the molecule and the consequent excitation of the latter. Unlike electronic excitation by photons, excitation by electron impact is subject to no spin selection rule. Thus transitions that are spin and/or orbitally forbidden for photon excitation are totally allowed for electron impact excitation. [Pg.117]

Despite the enormous impact that scanning probe methods have had on our understanding of reactions at oxide surfaces, both STM and AFM suffer from the lack of chemical specificity. The application of STM-inelastic electron tunneling spectroscopy is a potential solution as it can be used to measure the vibrational spectrum of individual molecules at the surface [69, 70]. [Pg.236]

Research Centers (IUCRC), 24 395 Inelastic mean free path (IMFP), 24 87 Inert fluids, 11 877 properties of, 11 879 Inert gas dilution, 11 456 Inert gases, 13 456 17 376-377. See also Helium- group elements Noble gases narcotic potency and solubility of, 17 377 Inert gas generators, 17 280 Inertial confinement fusion targets, microcapsules as, 16 460 Inertial impaction, in depth filtration theory, 11 339... [Pg.472]

Because the neutron direction is known, the FNAP approach does not require the use of coUimators to focus the incident beam and there is no need to pulse the source. However, as the neutrons are emitted in an essentially isotropic distribution, many neutrons still fail to impact the target bag and neutron shielding is needed in aU directions surrounding the source and bag regions. In addition, the scattering of the neutrons in the shielded material along with the resulting inelastic and capture... [Pg.75]


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See also in sourсe #XX -- [ Pg.49 ]




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