Incidence oriented

Figure 9 Slowness diagram At the interface between isotropic steel and a V-bntt weld with 10° inclination and perpendicular grain orientation the incident 45° (with regard to the sample top surface) shea.r wave will split into two quasi shear waves qSV and qSV( 2.)...

The external reflection of infrared radiation can be used to characterize the thickness and orientation of adsorbates on metal surfaces. Buontempo and Rice [153-155] have recently extended this technique to molecules at dielectric surfaces, including Langmuir monolayers at the air-water interface. Analysis of the dichroic ratio, the ratio of reflectivity parallel to the plane of incidence (p-polarization) to that perpendicular to it (.r-polarization) allows evaluation of the molecular orientation in terms of a tilt angle and rotation around the backbone [153]. An example of the p-polarized reflection spectrum for stearyl alcohol is shown in Fig. IV-13. Unfortunately, quantitative analysis of the experimental measurements of the antisymmetric CH2 stretch for heneicosanol [153,155] stearly alcohol [154] and tetracosanoic [156] monolayers is made difflcult by the scatter in the IR peak heights. 

Grazing incidence excitation of a fluorescent probe in a phospholipid monolayer can also be used to indicate order. The collective tilt of the molecules in a domain inferred from such measurements is indicative of long-range orientational order [222]. 

It is relatively straightforward to detemiine the size and shape of the three- or two-dimensional unit cell of a periodic bulk or surface structure, respectively. This infonnation follows from the exit directions of diffracted beams relative to an incident beam, for a given crystal orientation measuring those exit angles detennines the unit cell quite easily. But no relative positions of atoms within the unit cell can be obtained in this maimer. To achieve that, one must measure intensities of diffracted beams and then computationally analyse those intensities in tenns of atomic positions. 

An x-ray area detector can be used to collect the intensities of many reflections at a time. The crystal must be oriented in many different settings with respect to the incident beam but the detector needs to be positioned at only a few positions to collect all of the data. A charge coupled device (CCD) is used as the area detector on the Siemens SMART single crystal diffractometer system. The SMART detector consists of a flat 6-cm circular phosphorescent screen that converts x-ray photons to visible light photons. The screen is coupled to a tapered fiber optics bundle which is then coupled to a one inch by one inch square CCD chip. The CCD chip has 1024 x 1024 pixels each of which stores an electrical charge proportional to the number of... 

In the remainder of this section, we compare EISFs and Lorentzian line widths from our simulation of a fully hydrated liquid crystalline phase DPPC bilayer at 50°C with experiments by Kdnig et al. on oriented bilayers that, in order to achieve high degrees of orientation, were not fully hydrated. We consider two sets of measurements at 60°C on the IN5 time-of-flight spectrometer at the ILL one in which the bilayer preparations contained 23% (w/w) pure D2O and another in which bilayer orientation was preserved at 30% D2O by adding NaCl. The measurements were made on samples with two different orientations with respect to the incident neutron beam to probe motions either in the plane of the bilayers or perpendicular to that plane. 

X rays and so that the angle between the difiracting plane and the incident X rays is equal to the Bragg angle For a single crystal or epitaxial thin film, there is only one specimen orientation for each (hkl) plane where these difiraction conditions are satisfied. 

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