Imaging properties

Non-destructive testing - Radioscopic testing - Part 1 Quantitative measurement of imaging properties, prEN 13068-1... 

Novel agents have been designed to opbmize desirable biological and imaging properties The perfluoro rcrr-butyl moiety is being studied as a general fluorme... 

Anyone who has successfully used a microscope to image properties to which it is sensitive will sooner or later find himself wanting to be able to measure those properties with the spatial resolution which that microscope affords. Since an acoustic microscope images the elastic properties of a specimen, it must be possible to use it to measure elastic properties both as a measurement technique in its own right and also in order to interpret quantitatively the contrast in images. It emerged from contrast theory that the form of V(z) could be calculated from the reflectance function of a specimen, and also that the periodicity and decay of oscillations in V(z) can be directly related to the velocity and attenuation of Rayleigh waves. Both of these observations can be inverted in order to deduce elastic properties from measured V(z). 

Figure 4.4 Imaging property of a CMA as introduced in Fig. 4.2. The diagram shows the principal ray (solid curve with cone angle 0) together with a finite bundle of electrons (dashed curves) accepted by the entrance slit Sj. All electrons have the same kinetic energy fi in, and the spectrometer voltage U°p is selected such that these electrons are imaged from the source point Q to the focal point B.

Figure 4.6 Imaging property of a sector CMA. (a) Intensity distribution of electrons starting in the finite source volume and reaching the detector plane at different positions (the detector plane is fixed at the focal point of the principal trajectory, point B in Fig. 4.5, and aligned perpendicular to the principal trajectory), (b) Source volume produced by a photon beam of 2 mm diameter (see Fig. 1.13). Reprinted from Nucl. Inst. Meth. A, 260, Derenbach et al., 258 (1987) with kind permission of Elsevier Science - NL, Sara Burgerhartstraat 25, 1055 KV Amsterdam, The Netherlands.

Ilford is calling the microporous layer "nanoporous" since the particle and pore size in the layer they produce is weU below the micron level, with typical 20 nanometer particles while, practically, no particles are larger then 70 nanometers. The mineral oxides used in the porous products are surface treated in a proprietary process to balance physical properties such as brittleness and gloss with imaging properties such as color brilliance, layer transparency, and permanence. 

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