Image and diffraction pattern

Figure 8. Image and diffraction pattern from an (100) epitaxial. specimen of gold prepared in an unbaked UHV evaporator by depo.sition onto KOI and then transfer onto amorphous carbon. Here water vapour was the dominant residual gas (determined by mass spectrometry). The particles are square pyramidal single crystals.

Secondly, according to both HR M images and diffraction patterns, the intermetallic particles grow under particular orientation relationships with respect to the support. The following equations describe the relationships we have found ... 

Figure 3.32 The rotation angle between the image and diffraction pattern of a crystal.

Fig. 4.2. Plan-view HREM image and diffraction pattern for a 3.6 A SrCu02 phase prepared by eleaving. The superstructure disappears for an ion-milled sample.

Figure 2. Bright field TEM-images and diffraction pattern of the silicon layer with InAs precipitates.

Fig. 7 TEM image and diffraction pattern from microporous Si formed on low-doped p-type Si (from Ref 11).

Zero-loss filtering Both BF TEM images and diffraction patterns contain inelastically scattered electrons. The number of inelastic electrons increases with the increase of specimen thickness and they cause a diffuse background. Using a narrow sUt width (for example, 5 eV) at the ZLP, this filters out the majority of inelastic electrons and thus significantly improves the image contrast. 

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